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Applied Materials Accelerates Chip Defect Review with Next-Gen eBeam System

Applied Materials, Inc. (AMAT) 
Last applied materials, inc. earnings: 2/12 04:01 pm Check Earnings Report
Company Research Source: GlobeNewswire
SEMVision™ H20 enables better and faster analysis of nanoscale defects in leading-edge chipsSecond-generation “cold field emission” technology provides high-resolution imagingAI image recognition speeds up defect detection and classification SANTA CLARA, Calif., Feb. 19, 2025 (GLOBE NEWSWIRE) -- Applied Materials, Inc. today introduced a new defect review system to help leading semiconductor manufacturers continue pushing the limits of chip scaling. The company’s SEMVision™ H20 system combines the industry’s most sensitive electron beam (eBeam) technology with advanced AI image recognition to enable better and faster analysis of buried nanoscale defects in the world’s most advanced chips. eBeam imaging has long been an important tool for examining defects that are too small to be seen with optical techniques. Its ultra-high resolution enables analysis of the tiniest imperfections in a sea of billions of nanoscale circuit patterns. Traditionally, optical techniques are Show less Read more
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